Implementing enhanced scan chain diagnostics via bypass multiplexing structure

ABSTRACT

A method and system for implementing enhanced scan chain diagnostics via a bypass multiplexing structure. A full scan chain structure is partitioned into a plurality of separate chains, such as three separate partitioned chains, with bypass multiplexers for implementing enhanced scan chain diagnostics. Each of the separate partitioned chains includes bypass multiplexers with independent controls enabling scan data being routed through multiple different independent scan paths, potentially bypassing failing latches. The information acquired from a combination of full scans and partitioned scans is used for scan failure isolation to enable pinpoint identification of stuck-at-zero (SA0) and stuck-at-one (SA1) faults in the scan chain.

This application is a continuation application of Ser. No. 14/606,145filed Jan. 27, 2015.

FIELD OF THE INVENTION

The present invention relates generally to the data processing field,and more particularly, relates to a method and system for implementingenhanced scan chain diagnostics via a bypass multiplexing structure.

DESCRIPTION OF THE RELATED ART

Scan chains are the foundation of integrated circuit testing. Therefore,the ability to diagnosis scan chain fails is important.

A common implementation for scan chain diagnostics includes Exclusive-or (XOR) books periodically inserted in the scan path to inject valuesbeyond failing locations. This method only detects the fail closest tothe scan out pin and results in large amounts of fail data, as everylocation before the fail location will be logged as a fail.

A need exists for an effective new method and structure to diagnosisscan chain fails. It is desirable to provide such method forimplementing diagnostics of multiple fails leading to fabricationprocess and design changes that improve later yield and reduce waste.

SUMMARY OF THE INVENTION

Principal aspects of the present invention are to provide a method andsystem for implementing enhanced scan chain diagnostics via a bypassmultiplexing structure. Other important aspects of the present inventionare to provide such method and system substantially without negativeeffects and that overcome some of the disadvantages of prior artarrangements.

In brief, a method and system for implementing enhanced scan chaindiagnostics via a bypass multiplexing structure. A full scan chainhaving a scan input to a scan output is partitioned into a plurality ofseparate partitioned chains with the bypass multiplexer structure forimplementing enhanced scan chain diagnostics. Each of the separatepartitioned chains includes bypass multiplexers with independentcontrols enabling scan data being routed from the scan input to the scanoutput through multiple different independent scan paths, potentiallybypassing failing latches. Information acquired from a combination offull scans and separate partitioned scans is used for scan failureisolation, to enable pinpoint identification of stuck-at-zero (SA0) andstuck-at-one (SA1) faults in the scan chain.

In accordance with features of the invention, each bypass multiplexerfor the separate partitioned chains has an independent select, forexample with three separate partitioned chains three separate wires orthe result of a decode of two wires. Each of the separate partitionedchains has a unique path from the scan input to the scan output.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention together with the above and other objects andadvantages may best be understood from the following detaileddescription of the preferred embodiments of the invention illustrated inthe drawings, wherein:

FIG. 1 illustrates an example full scan chain bypass multiplexingstructure partitioned into a plurality of separate partitioned chains,such as three partitioned chains as shown, with bypass multiplexers forimplementing enhanced scan chain diagnostics in accordance withpreferred embodiments;

FIG. 2 illustrates example operations for the full scan chain and thethree partitioned chains provided by the bypass multiplexing structurefor implementing enhanced scan chain diagnostics used to diagnose a scanchain fail in accordance with preferred embodiments;

FIG. 3 illustrates the example full scan chain structure of FIG. 1 withan example fail bit with scan chain results of multiple test scans forthe example single fail analysis in accordance with preferredembodiments;

FIG. 4 illustrates further example operations for the full scan chainand the three partitioned chains provided by the bypass multiplexersused to diagnose a scan chain double fail in accordance with preferredembodiments;

FIG. 5 illustrates the example full scan chain structure of FIG. 1 withan example double fail bits with scan chain results of multiple testscans for the example double fail analysis in accordance with preferredembodiments;

FIG. 6 illustrates further example operations for the full scan chainand the three colored chains provided by the bypass multiplexers used todiagnose a scan chain triple fail in accordance with preferredembodiments;

FIG. 7 illustrates the example full scan chain structure of FIG. 1 withan example double fail bits with scan chain results of multiple testscans for the example triple fail analysis in accordance with preferredembodiments;

FIG. 8 is a block diagram representation illustrating an examplecomputer system and operating system for implementing enhanced scanchain diagnostics in accordance with the preferred embodiment; and

FIG. 9 is a block diagram illustrating a computer program product inaccordance with the preferred embodiment.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

In the following detailed description of embodiments of the invention,reference is made to the accompanying drawings, which illustrate exampleembodiments by which the invention may be practiced. It is to beunderstood that other embodiments may be utilized and structural changesmay be made without departing from the scope of the invention.

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting of the invention. Asused herein, the singular forms “a”, “an” and “the” are intended toinclude the plural forms as well, unless the context clearly indicatesotherwise. It will be further understood that the terms “comprises”and/or “comprising,” when used in this specification, specify thepresence of stated features, integers, steps, operations, elements,and/or components, but do not preclude the presence or addition of oneor more other features, integers, steps, operations, elements,components, and/or groups thereof.

In accordance with features of the invention, a method and system areprovided for implementing enhanced scan chain diagnostics via a bypassmultiplexing structure in accordance with the preferred embodiment.

Having reference now to the drawings, in FIG. 1, there is shown anexample bypass multiplexing structure generally designated by thereference character 100 in accordance with the preferred embodiment. Thebypass multiplexing structure 100 includes a full scan chain 100extending between a scan input (SI) 102 and a scan output (SO) 104. Asshown, the bypass multiplexing structure full scan chain 100 ispartitioned into a plurality of separate chains with the bypassmultiplexer structure with a plurality of bypass multiplexers 106, 108,112, 114, 116, and 118 for implementing enhanced scan chain diagnostics.Each of the bypass multiplexers 106, 108, 112, 114, 116, and 118 hasindependent controls enabling scan data being routed from the scan inputSI, 102 to the scan output S0, 104 through multiple differentindependent scan paths, potentially bypassing failing latches.

In accordance with features of the invention, information acquired froma combination of full scans and separate partitioned scans is used forscan failure isolation, to enable pinpoint identification ofstuck-at-zero (SA0) and stuck-at-one (SA1) faults in the scan chain.

A first separate partitioned scan chain includes scan block 120, 122,bits 12, 11, multiplexer 110, scan blocks 124, 126, bits 6, 5, andmultiplexers 116, 118. A second separate partitioned scan chain includesmultiplexer 106, scan blocks 128, 130, bits 10, 9, multiplexer 112, scanblocks 132, 134, bits 4, 3, and multiplexer 118. A third separatepartitioned scan chain includes multiplexer 108, scan blocks 136, 138,bits 8, 7, multiplexer 114, scan blocks 140, 142, bits 2, 1, andmultiplexers 116, 118. Multiplexer 118 couples each of the first, secondand third separate partitioned scan chains to the scan output S0, 104.

In accordance with features of the invention, each bypass multiplexerfor the separate partitioned chains has an independent select, forexample with three separate partitioned chains three independent selectS1, S2, and S3, defining separate partitioned scan chain paths shown inFIG. 1. The three independent select S1, S2, and S3 optionally areprovided with three separate wires or the result of a decoder with twowires (not shown). Each of the first, second and third separatepartitioned chains provides a unique path from the scan input to thescan output.

Referring now to FIG. 2, there are shown example operations with thefull scan chain and the three partitioned chains provided by the bypassmultiplexing structure 100 for implementing enhanced scan chaindiagnostics used to diagnose a scan chain fail in accordance withpreferred embodiments. Diagnostics begin with running full scan (FS)tests including stuck-at-zero (SA0) and stuck-at-one (SA1) full scantests as indicated in a block 200. Checking for full scan passingresults is performed as indicated in a decision block 202. With fullscan passing results, the scan paths are good and the operations arecompleted as indicated in a block 204. With a fail in the full scanresults, then six separate partitioned scan tests includingstuck-at-zero (SA0) and stuck-at-one (SA1) scan tests for each of thefirst, second and third separate partitioned chains as indicated in ablock 206. Checking if all of first, second and third separatepartitioned chains fail is performed as indicated in a decision block208. With at least one fail in all of first, second and third separatepartitioned chains, then a triple fail analysis is performed asindicated in a block 210. For example, an example triple fail analysisis illustrated in FIGS. 6 and 7.

Checking if two of the three first, second and third separatepartitioned chains fail is performed as indicated in a decision block212. With a fail in two of the three first, second and third separatepartitioned chains, then a double fail analysis is performed asindicated in a block 214. For example, an example double fail analysisis illustrated in FIGS. 4 and 5.

Checking if one of the three first, second and third separatepartitioned chains fail is performed as indicated in a decision block216. When a fail in one of the three first, second and third separatepartitioned chains is not identified, then a full scan fail analysis itperformed, for example, running 3 tests of load full scan, then unloadpartitioned for each third separate partitioned chain, points to leg orlegs of failing multiplexer as indicated in a block 218. With a fail inone of the three first, second and third separate partitioned chains,then a single fail analysis is performed with scan fill value of nextpassing partitioned chain as indicated in a block 220. For example, withan identified first partitioned chain fail, requests second partitionedchain fill as shown at block 220. A full scan for one cycle is performedas indicated in a block 222, for example, moving fail to passingsection. As indicated in a block 224, a scan out of next passingpartitioned chain results point to failures in failing partitioned chaingroup. Checking is performed to determine if failing partitioned chainscan bypass test is needed as indicated in a decision block 226. If notthe operations are completed as indicated in a block 228. If the failingpartitioned chain scan bypass test is needed, then scan out the nextpassing partitioned chain as indicated in a block 230. For example, withan identified first partitioned chain fail, requests next or secondpartitioned chain fill as shown at block 230. As indicated in a block232, a scan out of next passing partitioned chain results point tofailures in failing partitioned chain group.

Referring also to FIG. 3, the example full scan chain structure 100 ofFIG. 1 with fail with scan chain results of multiple test scans for theexample single fail analysis in accordance with preferred embodiments.As shown, an example fail bit 8 in the third partitioned chain isidentified. A next passing partitioned chain or first partitioned chainscan is shown at line 1 that loads 1 every where but at fail. A fullscan as indicated in a line 2 moves the fail area to the next or firstpartitioned chain. A next first partitioned chain scan is shown at line3 that pulls out bit 6 change, which points to SA0 at Bit 7 or 8.

Referring now to FIG. 4, there are shown further example operations forthe full scan chain and the three partitioned chains provided by thebypass multiplexing structure 100 to diagnose a scan chain double failin accordance with preferred embodiments. The double fail diagnosticsstart by using the passing partitioned chain for fill value as indicatedin a block 400. A full scan for one cycle is performed, moving fail topassing section as indicated in a block 402. Next a scan out of passingpartitioned chain, results point to failure in previous partitionedchain pairs groups as indicated in a block 404. Checking if secondpartitioned chain now passing above a failing partitioned chain pairgroup is performed as indicated in a decision block 406. As indicated ina block 408, with second partitioned chain now passing above a failingpartitioned chain pair group, then fill value with passing partitionedchain, scan pulse second partitioned chain enough to feed throughpossible failing second partitioned chain to next passing partitionedchain (loading value from previous/working second partitioned chain),then scan out passing partitioned chain, and return to decision block406. Otherwise, some second partitioned chains are not separable asindicated in a block 410.

Checking if first partitioned chain now passing below a failingpartitioned chain pair group is performed as indicated in a decisionblock 412. As indicated in a block 414, with the first partitioned chainnow passing below a failing partitioned chain pair group, then fillvalue with passing partitioned chain, scan pulse first partitioned chainenough to feed through to next passing partitioned chain, then scan outpassing partitioned chain, and determine if target first partitionedchain is good, and return to decision block 412. Otherwise, some firstpartitioned chains are not separable as indicated in a block 416.

Referring also to FIG. 5 illustrates the example full scan chainstructure 100 with an example double fail bits with scan chain resultsof multiple test scans for the example double fail analysis inaccordance with preferred embodiments. As shown, an example fail bit 9in the second partitioned chain and an example fail bit 8 in the thirdpartitioned chain are identified in the full scan chain structure 100.As shown at a first line 1, the first partitioned chain scan loads 1everywhere but failing second and third partitioned chain pair. As shownat a first line 2, full scan moves fail to working first partitionedchain, also proving bits 1-6 are working. As shown at first line 3, scanmoves show fails in partitioned chain bits 7-10. As shown at middlelines 1, and 2, the first partitioned chain scan fail is in partitionedchain pair Bit 7-10, and loads 1 everywhere but failing thirdpartitioned chain, then moves third partitioned chain to working area,then scan out working area showing SA0 at Bit 7 or 8. As shown at thirdlines 1, 2, and 3, the first partitioned chain scan loads 1 everywherebut failing second partitioned chain, then moves first partitioned chainfrom working area thru third partitioned chain failing area to thirdpartitioned chain working area, then scan out working area showing SA0at Bit 9 or 10. The first fail of the two is isolated in 10 tests andboth fails are isolated in 11 tests. The unload partitioned chain atline middle lines 1, 2, 3 may vary depending on whether or not part of aworking partitioned chain is below a working section of a failingpartitioned chain. In this example, there was no first partitioned chainbelow the working bits 3 and 4 in the second partitioned chain, so asecond partitioned chain unload was used in lieu of a first partitionedchain unload. More fails in adjacent partitioned chains can limitdiagnostics.

Referring now to FIG. 6, there are shown further example operations forthe full scan chain and the three partitioned chains provided by thebypass multiplexer structure 100 used to diagnose a scan chain triplefail in accordance with preferred embodiments. As indicated in a block600, the triple fail diagnostics start by trying to find a twopartitioned chain one hop path. For each partitioned chain/stuckval, runpartitioned chain fill of −value, then unload with next partitionedchain as indicated in a block 602. Checking for any −value detected isperformed as indicated in a decision block 604. If any −value detected,points to partitioned chain fail and next partitioned chain faillocations as indicated in a block 606. Otherwise run partitioned chainfill of −value, then unload previous partitioned chain as indicated in ablock 608. Checking for any −value detected is performed as indicated ina decision block 610. If any −value detected, points to partitionedchain fail and next partitioned chain fail locations as indicated in ablock 611. Otherwise, checking for all partitioned chains/values triedas indicated in a decision block 612. If all tried could continue to tryto find a two partitioned chain path that hops back as indicated in ablock 614. Otherwise, if any −value is not detected, return to block 602and continue as before.

As indicated in a block 614, for each partitioned chain/stuckval, runpartitioned chain fill of −value, then scan next partitioned chainenough to load the partitioned chain then unload the partitioned chainas indicated in a block 615. Checking for any −value detected isperformed as indicated in a decision block 616. If any detected, pointsto partitioned chain fail and next partitioned chain fail locations asindicated in a block 618. Otherwise for each line and stuck values, runa fill of −value, then scan pervious line enough to load the line, thenunload the line in block 620. Checking as indicated in a decision block622. If any detected, points to partitioned chain fail and previouspartitioned chain fail locations as indicated in a block 624. Otherwisechecking for all partitioned chains/values tried is performed asindicated in a decision block 626. Otherwise, return to block 614 andcontinue as before. As indicated in a block 628, triple hops can beattempted but are probably not practical.

Referring now to FIG. 7 illustrates the example full scan chainstructure 100 with an example triple fail bits with scan chain resultsof multiple test scans for the example triple fail analysis inaccordance with preferred embodiments. As shown, an example fail bit 12in the first partitioned chain, an example fail bit 9 in the secondpartitioned chain and an example fail bit 2 in the third partitionedchain are identified in the full scan chain structure 100. As shown atfirst lines 1, 2, a third partitioned chain, and first partitioned chainscan shows SA0 at Bit 11 or 12; SA0 at Bit 1 or 2, Bits 5-8 good. Asshown at second lines 1, 2, a third partitioned chain, and secondpartitioned chain scan shows SA0 at Bit 9 or 10; Bits 3-4 good. Thethree fails are isolated with twelve tests.

Once a double partitioned chain hop is found to work other fails belowthe loading partitioned chain detect fail and above the unloadingpartitioned chain detected fail can also be found. Note that fails onbypass paths will not be detected in the full scan, but act as any otherfail when looking at partitioned chain paths. Note that fails at thebeginning and end of the scan chain can require a slightly differentmethod, but can also be separable and diagnosable.

In FIG. 8, there is shown an exemplary computer test system generallydesignated by the reference character 800 for implementing scan chaindiagnostics in accordance with the preferred embodiment. Computer system800 includes a main processor 802 or central processor unit (CPU) 802coupled by a system bus 806 to a memory management unit (MMU) 808 andsystem memory including a dynamic random access memory (DRAM) 880, anonvolatile random access memory (NVRAM) 812, and a flash memory 814. Amass storage interface 816 coupled to the system bus 806 and MMU 808connects a direct access storage device (DASD) 818 and a CD-ROM drive820 to the main processor 802. Computer system 800 includes a displayinterface 822 connected to a display 824, and a test interface 826coupled to the system bus 806. A device under test 828 is coupled to thetest interface 826. The device under test 828 includes, for example, anintegrated circuit wafer, a module, or a system. Computer system 800includes an operating system 830, a test control program 832 tangiblyembodied on a non-transitory computer readable storage medium includingprogram means or program instructions for carrying out the methods forimplementing scan chain diagnostics via a bypass multiplexing structure,and a set of test patterns 834 of the preferred embodiment resident in amemory 836.

Computer test system 800 is shown in simplified form sufficient forunderstanding the present invention. The illustrated computer testsystem 800 is not intended to imply architectural or functionallimitations. The present invention can be used with various hardwareimplementations and systems and various other internal hardware devices,for example, multiple main processors.

Referring now to FIG. 9, an article of manufacture or a computer programproduct 900 of the invention is illustrated. The computer programproduct 900 is tangibly embodied on a non-transitory computer readablestorage medium that includes a recording medium 902, such as, a floppydisk, a high capacity read only memory in the form of an optically readcompact disk or CD-ROM, a tape, or another similar computer programproduct. Recording medium 902 stores program means 904, 906, 908, and910 on the medium 902 for carrying out the methods for implementingenhanced scan chain diagnostics via a bypass multiplexing structure,such as, the bypass multiplexing structure 100.

A sequence of program instructions or a logical assembly of one or moreinterrelated modules defined by the recorded program means 904, 906,908, and 910, direct the system 100 for implementing enhanced scan chaindiagnostics via the bypass multiplexing structure of the preferredembodiments.

While the present invention has been described with reference to thedetails of the embodiments of the invention shown in the drawing, thesedetails are not intended to limit the scope of the invention as claimedin the appended claims.

1. A method for implementing enhanced scan chain diagnostics via a bypass multiplexing structure comprising: providing a scan chain; partitioning said scan chain into a plurality of separate partitioned chains with bypass multiplexers for implementing enhanced scan chain diagnostics; said bypass multiplexers having independent controls enabling scan data to be routed through multiple different independent scan paths; providing a processor, said processor performing the steps of routing scan data through a combination of said chain scan and said separate partitioned chains and acquiring information used for scan failure isolation, to enable pinpoint identification of stuck-at-zero (SA0) and stuck-at-one (SA1) faults in the scan chain including running full SA0 and SA1 scan tests; responsive to identifying a fail in the full scan results, running separate partitioned SA0 and SA1 scan tests for each of plurality of separate partitioned chains; responsive to identifying a fail in a respective separate portioned chains, running the full SA0 and SA1 scan tests, moving the fail to a passing scan path section; responsive to identifying a required failing partitioned chain scan bypass test, scanning a next passing partitioned chain results for a number of number of cycles to point to respective fail location.
 2. The method as recited in claim 1 includes said processor performing the steps of running a full zero scan test and running a full one scan test.
 3. The method as recited in claim 2 wherein said plurality of separate partitioned chains includes three separate partitioned chains and includes responsive to identifying a full scan fail, running a full zero scan test and running a full one scan test for each of said three separate partitioned chains.
 4. The method as recited in claim 3 further includes responsive to identifying a scan fail for each of said three separate partitioned chains, preforming a triple fail analysis.
 5. The method as recited in claim 3 further includes responsive to identifying a scan fail for two of said three separate partitioned chains, preforming a double fail analysis.
 6. The method as recited in claim 3 further includes responsive to identifying a scan fail for one of said three separate partitioned chains, preforming a single fail analysis.
 7. The method as recited in claim 3 further includes responsive to not identifying a scan fail for one of said three separate partitioned chains, preforming a full scan fail analysis. 8-15. (canceled) 